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Proton insertion into ruthenium oxide film prepared by pulsed laser deposition

  • U.S. Army Research Laboratory
  • Los Alamos National Laboratory

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

Electrochemical properties of ruthenium oxide (RuO2) films with different degrees of crystallinity were studied. The RuO2 films were grown by pulsed laser deposition at substrate temperatures from 30 to 400°C. At low temperatures, the amorphous phase of RuO2 films was formed. At high temperatures, the crystalline phase of RuO2 films was obtained. From the cyclic voltammetric study in H2SO4 solution, it was found that the current response for an electrode of the amorphous RuO, film was higher than that of the crystalline film. A proton diffusion length of larger than 5.8 nm was obtained on the RuO2 film prepared at 30°C.

Original languageEnglish
Pages (from-to)1068-1070
Number of pages3
JournalJournal of the Electrochemical Society
Volume143
Issue number3
DOIs
StatePublished - Mar 1996

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