Abstract
A proposal to determine Spin relaxation time (T1) by all-electrical measurements from the I-V characteristics was discussed. It was shown that several features specific to semiconductors could be exploited to provide a sensitive probe for T1. The g-factor and the degree of the injected-carrier spin polarization was also calculated in a magnetic p-n junction.
| Original language | English |
|---|---|
| Pages (from-to) | 221-223 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 82 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jan 13 2003 |
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