Process-induced passivation and stability for high yield Y:Ba:Cu:O superconductors

P. Y. Hsieh; James Ye; L. Q. Wang; D. Shaw; J. P. Zheng; Q. F. Xiao

doi:10.1117/12.947466

Process-induced passivation and stability for high yield Y:Ba:Cu:O superconductors

P. Y. Hsieh
, James Ye
, L. Q. Wang
, D. Shaw
, J. P. Zheng
, Q. F. Xiao

Department of Electrical Engineering

SUNY Buffalo
SUNY Albany

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	15
Number of pages	1
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	948
DOIs	https://doi.org/10.1117/12.947466
State	Published - Aug 23 1988

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title = "Process-induced passivation and stability for high yield Y:Ba:Cu:O superconductors",

author = "Hsieh, \{P. Y.\} and James Ye and Wang, \{L. Q.\} and D. Shaw and Zheng, \{J. P.\} and Xiao, \{Q. F.\}",

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AU - Hsieh, P. Y.

AU - Ye, James

AU - Wang, L. Q.

AU - Shaw, D.

AU - Zheng, J. P.

AU - Xiao, Q. F.

PY - 1988/8/23

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JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

ER -

Process-induced passivation and stability for high yield Y:Ba:Cu:O superconductors

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