TY - GEN
T1 - Process for evaluating effects of trainsient currents in pulse initiated systems
AU - Martinez, Andrea M.
AU - Blake, Sharece
AU - Upia, Antonio
AU - Muffoletto, Daniel P.
AU - Burke, Kevin M.
AU - Zirnheld, Jennifer L.
PY - 2013
Y1 - 2013
N2 - Pulse initiated systems are designed to reliably and consistently operate when energized above a threshold value. The situation exists where these systems can be exposed to pulsed and transient signals that are directly injected due to external coupling factors that to not initiate the system. This paper will examine the potential for transient currents to cause unforeseen stress to these electrical devises, which can lead to aging, malfunction and possibly failure. This work will address the process of quantifying the detrimental effects, in order to understand non-ideal performance or the mechanics of failure due to pulsed and other transient currents that are less than what is required to initiate. A test and data acquisition circuit is designed and built that enables a constant current source to pulse a device under test. The data collected will be compared to the theoretical results of a finite element multi-physics simulation. Upon completion, any changes in resistive properties will be evaluated to determine if there were quantifiable effects that have contributed to the aging process.
AB - Pulse initiated systems are designed to reliably and consistently operate when energized above a threshold value. The situation exists where these systems can be exposed to pulsed and transient signals that are directly injected due to external coupling factors that to not initiate the system. This paper will examine the potential for transient currents to cause unforeseen stress to these electrical devises, which can lead to aging, malfunction and possibly failure. This work will address the process of quantifying the detrimental effects, in order to understand non-ideal performance or the mechanics of failure due to pulsed and other transient currents that are less than what is required to initiate. A test and data acquisition circuit is designed and built that enables a constant current source to pulse a device under test. The data collected will be compared to the theoretical results of a finite element multi-physics simulation. Upon completion, any changes in resistive properties will be evaluated to determine if there were quantifiable effects that have contributed to the aging process.
UR - https://www.scopus.com/pages/publications/84888585531
U2 - 10.1109/PPC.2013.6627496
DO - 10.1109/PPC.2013.6627496
M3 - Conference contribution
AN - SCOPUS:84888585531
SN - 9781467351676
T3 - Digest of Technical Papers-IEEE International Pulsed Power Conference
BT - 2013 19th IEEE Pulsed Power Conference, PPC 2013
T2 - 2013 19th IEEE Pulsed Power Conference, PPC 2013
Y2 - 16 June 2013 through 21 June 2013
ER -