Abstract
Advances in the development of techniques for the energy and mass analysis of ejected particles form the basis of their use as surface analytical spectroscopies. Methods such as X-ray photoelectron spectroscopy (XPS or ESCA), low-energy ion-scattering spectroscopy (ISS), and secondary ion mass spectrometry (SIMS) are becoming more widely applicable to problems in the chemical analysis of coatings surfaces and interfaces. In this paper a brief review of instrumentation and theory allows projection of new capabilities for the method. Recent progress in the analysis of homopolymer and multicomponent polymer interfaces is described.
| Original language | English |
|---|---|
| Pages (from-to) | 157-170 |
| Number of pages | 14 |
| Journal | ASTM Special Technical Publication |
| Issue number | 1119 |
| State | Published - 1992 |
| Event | Analysis of Paints and Related Materials: Current Techniques for Solving Coatings Problems - Pittsburgh, PA, USA Duration: May 13 1990 → May 14 1990 |
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