Abstract
High quality epitaxial thin films of cubic UC2 were synthesized using a solution based technique. The films were characterized using XRD, UPS, Raman, and resistivity. The substrate lattice is yttrium stabilized zirconia and serves to stabilize the high temperature cubic phaseof UC2 (>1765 C) at room temperature. The resistivity and UPS data indicate that UC 2 has relatively low electrical conductivity consistent with HSE hybrid DFT calculations showing a narrow band gap. In situ XRD measurements show that the UC2 films oxidize to U3O8 above 200 C.
| Original language | English |
|---|---|
| Pages (from-to) | 4373-4377 |
| Number of pages | 5 |
| Journal | Chemistry of Materials |
| Volume | 25 |
| Issue number | 21 |
| DOIs | |
| State | Published - Nov 12 2013 |
Keywords
- actinide carbide
- epitaxial thin film
- nuclear energy
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