Abstract
Although plasma source MS can provide microanalyses and spatially and time-resolved analyses, the technique suffers from several serious shortcomings. Denise M. McClenathan, Steven J. Ray, William C. Wetzel, and Gary M. Hieftje at Indiana University discuss how TOFMS can overcome some of these problems and provide multielement and multi-isotope analysis of fast transient signals.
| Original language | English |
|---|---|
| Pages (from-to) | 158A-166A |
| Journal | Analytical Chemistry |
| Volume | 76 |
| Issue number | 9 |
| State | Published - May 1 2004 |
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