Abstract
The measurement of electrical resistance, capacitance and impedance is central to the electrical characterization of materials, whether the materials are in bulk, thick film or thin film forms. However, there are numerous common pitfalls in the measurement. The pitfalls mainly relate to the electrode design, electrode configuration and measurement instrument utilization. This commentary provides an overview of these pitfalls, along with the methods of measurement.
| Original language | English |
|---|---|
| Pages (from-to) | 6567-6574 |
| Number of pages | 8 |
| Journal | Journal of Electronic Materials |
| Volume | 50 |
| Issue number | 12 |
| DOIs |
|
| State | Published - Dec 2021 |
Keywords
- Capacitance
- Electrical properties
- Measurement
- Methods
- Pitfalls
- Resistance
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