Photothermal cantilever deflection spectroscopy of a photosensitive polymer

Minhyuk Yun; Seonghwan Kim; Dongkyu Lee; Namchul Jung; Inseok Chae; Sangmin Jeon; Thomas Thundat

doi:10.1063/1.4719521

Photothermal cantilever deflection spectroscopy of a photosensitive polymer

Minhyuk Yun
, Seonghwan Kim
, Dongkyu Lee
, Namchul Jung
, Inseok Chae
, Sangmin Jeon
, Thomas Thundat

Department of Chemical and Biological Engineering

Pohang University of Science and Technology
University of Alberta

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

The mechanical and chemical information of a poly(methyl methacrylate) (PMMA) film on a microcantilever were simultaneously acquired by photothermal cantilever deflection spectroscopy as a function of ultraviolet (UV) irradiation time. Nanomechanical infrared (IR) spectra from the PMMA-coated microcantilever agreed well with the Fourier transform infrared spectroscopy (FTIR) spectra of PMMA on gold-coated silicon wafer. The decreasing intensities of nanomechanical IR peaks represent chemical as well as mechanical information of UV radiation-induced photodegradation processes in the PMMA which cannot be obtained by a conventional FTIR technique. The observed decrease in the resonance frequency of the microcantilever is related to the change in the Young's modulus of the PMMA under UV exposure.

Original language	English
Article number	204103
Journal	Applied Physics Letters
Volume	100
Issue number	20
DOIs	https://doi.org/10.1063/1.4719521
State	Published - May 14 2012

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10.1063/1.4719521

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title = "Photothermal cantilever deflection spectroscopy of a photosensitive polymer",

abstract = "The mechanical and chemical information of a poly(methyl methacrylate) (PMMA) film on a microcantilever were simultaneously acquired by photothermal cantilever deflection spectroscopy as a function of ultraviolet (UV) irradiation time. Nanomechanical infrared (IR) spectra from the PMMA-coated microcantilever agreed well with the Fourier transform infrared spectroscopy (FTIR) spectra of PMMA on gold-coated silicon wafer. The decreasing intensities of nanomechanical IR peaks represent chemical as well as mechanical information of UV radiation-induced photodegradation processes in the PMMA which cannot be obtained by a conventional FTIR technique. The observed decrease in the resonance frequency of the microcantilever is related to the change in the Young's modulus of the PMMA under UV exposure.",

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T1 - Photothermal cantilever deflection spectroscopy of a photosensitive polymer

AU - Yun, Minhyuk

AU - Kim, Seonghwan

AU - Lee, Dongkyu

AU - Jung, Namchul

AU - Chae, Inseok

AU - Jeon, Sangmin

AU - Thundat, Thomas

PY - 2012/5/14

Y1 - 2012/5/14

N2 - The mechanical and chemical information of a poly(methyl methacrylate) (PMMA) film on a microcantilever were simultaneously acquired by photothermal cantilever deflection spectroscopy as a function of ultraviolet (UV) irradiation time. Nanomechanical infrared (IR) spectra from the PMMA-coated microcantilever agreed well with the Fourier transform infrared spectroscopy (FTIR) spectra of PMMA on gold-coated silicon wafer. The decreasing intensities of nanomechanical IR peaks represent chemical as well as mechanical information of UV radiation-induced photodegradation processes in the PMMA which cannot be obtained by a conventional FTIR technique. The observed decrease in the resonance frequency of the microcantilever is related to the change in the Young's modulus of the PMMA under UV exposure.

AB - The mechanical and chemical information of a poly(methyl methacrylate) (PMMA) film on a microcantilever were simultaneously acquired by photothermal cantilever deflection spectroscopy as a function of ultraviolet (UV) irradiation time. Nanomechanical infrared (IR) spectra from the PMMA-coated microcantilever agreed well with the Fourier transform infrared spectroscopy (FTIR) spectra of PMMA on gold-coated silicon wafer. The decreasing intensities of nanomechanical IR peaks represent chemical as well as mechanical information of UV radiation-induced photodegradation processes in the PMMA which cannot be obtained by a conventional FTIR technique. The observed decrease in the resonance frequency of the microcantilever is related to the change in the Young's modulus of the PMMA under UV exposure.

UR - https://www.scopus.com/pages/publications/84861829962

U2 - 10.1063/1.4719521

DO - 10.1063/1.4719521

M3 - Article

AN - SCOPUS:84861829962

SN - 0003-6951

VL - 100

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

M1 - 204103

ER -

Photothermal cantilever deflection spectroscopy of a photosensitive polymer

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