Abstract
The photoconductivity σph of amorphous silicon (a-Si:H) of various thicknesses is described as a function of temperature, wavelength and light intensity. The room temperature σph is very dependent on the dark Fermi level and the sensitization is a consequence of a change in the energy band bending. Under illumination, the power dependence of σph on intensity K can be divided into several regions for all thicknesses. However, there are more variations in K when light is injected. The K value covers the range of 0.2->1.0. This indicates that the slope of distribution of density of states in the gap varies considerably for the different cases. Different wavelengths of illuminating light also reveal a similar situation. The temperature dependence of σph and activation energy Ea for films of various thicknesses show the same trend. Both σph and Ea decrease with temperature. The rate of decrease for thin samples is less than that for thick ones. This result is analyzed and explained by means of a model.
| Original language | English |
|---|---|
| Pages (from-to) | 169-179 |
| Number of pages | 11 |
| Journal | Solar Cells |
| Volume | 25 |
| Issue number | 2 |
| DOIs | |
| State | Published - Nov 1988 |
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