Orientational domains in metalorganic chemical vapor deposited CdTe(111) film on cube-textured Ni

G. C. Wang; L. H. Zhang; Kim Kisslinger; C. Gaire; A. Goyal; I. Bhat; T. M. Lu

doi:10.1016/j.tsf.2013.01.082

Orientational domains in metalorganic chemical vapor deposited CdTe(111) film on cube-textured Ni

G. C. Wang
, L. H. Zhang
, Kim Kisslinger
, C. Gaire
, A. Goyal
, I. Bhat
, T. M. Lu

Department of Chemical and Biological Engineering

Rensselaer Polytechnic Institute
Brookhaven National Laboratory

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

CdTe thin film was grown by metal organic chemical vapor deposition on cube-textured Ni substrate. The microstructures of the CdTe film and Ni substrate were studied using transmission electron microscopy (TEM) lattice imaging in cross sectional. The orientational relationships of multiple hetereoepitaxial domains in the CdTe film were examined by TEM diffraction. The observed epitaxy is [111]_CdTe//[001]_Ni. The adjacent domains in CdTe film have a 30 rotation with respect to each other as inferred by the observed different diffraction patterns obtained from different zone axes. The high resolution lattice imaging shows that lamellar twins dominate within each domain. Our results are compared with CdTe(111) film epitaxially grown on Si(001) substrate by molecular beam epitaxy reported in the literature.

Original language	English
Pages (from-to)	217-221
Number of pages	5
Journal	Thin Solid Films
Volume	531
DOIs	https://doi.org/10.1016/j.tsf.2013.01.082
State	Published - 2013

Keywords

Cadmium telluride film
Cube-textured nickel sheet
Epitaxy
Lattice imaging
Metal organic chemical vapor deposition
Orientational domains
Out-of-plane misalignment
Transmission electron diffraction

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10.1016/j.tsf.2013.01.082

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@article{45a691a798db4bb8bf9d3972f1b9ee8b,

title = "Orientational domains in metalorganic chemical vapor deposited CdTe(111) film on cube-textured Ni",

abstract = "CdTe thin film was grown by metal organic chemical vapor deposition on cube-textured Ni substrate. The microstructures of the CdTe film and Ni substrate were studied using transmission electron microscopy (TEM) lattice imaging in cross sectional. The orientational relationships of multiple hetereoepitaxial domains in the CdTe film were examined by TEM diffraction. The observed epitaxy is [111]CdTe//[001]Ni. The adjacent domains in CdTe film have a 30 rotation with respect to each other as inferred by the observed different diffraction patterns obtained from different zone axes. The high resolution lattice imaging shows that lamellar twins dominate within each domain. Our results are compared with CdTe(111) film epitaxially grown on Si(001) substrate by molecular beam epitaxy reported in the literature.",

keywords = "Cadmium telluride film, Cube-textured nickel sheet, Epitaxy, Lattice imaging, Metal organic chemical vapor deposition, Orientational domains, Out-of-plane misalignment, Transmission electron diffraction",

author = "Wang, \{G. C.\} and Zhang, \{L. H.\} and Kim Kisslinger and C. Gaire and A. Goyal and I. Bhat and Lu, \{T. M.\}",

year = "2013",

doi = "10.1016/j.tsf.2013.01.082",

language = "English",

volume = "531",

pages = "217--221",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Orientational domains in metalorganic chemical vapor deposited CdTe(111) film on cube-textured Ni

AU - Wang, G. C.

AU - Zhang, L. H.

AU - Kisslinger, Kim

AU - Gaire, C.

AU - Goyal, A.

AU - Bhat, I.

AU - Lu, T. M.

PY - 2013

Y1 - 2013

N2 - CdTe thin film was grown by metal organic chemical vapor deposition on cube-textured Ni substrate. The microstructures of the CdTe film and Ni substrate were studied using transmission electron microscopy (TEM) lattice imaging in cross sectional. The orientational relationships of multiple hetereoepitaxial domains in the CdTe film were examined by TEM diffraction. The observed epitaxy is [111]CdTe//[001]Ni. The adjacent domains in CdTe film have a 30 rotation with respect to each other as inferred by the observed different diffraction patterns obtained from different zone axes. The high resolution lattice imaging shows that lamellar twins dominate within each domain. Our results are compared with CdTe(111) film epitaxially grown on Si(001) substrate by molecular beam epitaxy reported in the literature.

AB - CdTe thin film was grown by metal organic chemical vapor deposition on cube-textured Ni substrate. The microstructures of the CdTe film and Ni substrate were studied using transmission electron microscopy (TEM) lattice imaging in cross sectional. The orientational relationships of multiple hetereoepitaxial domains in the CdTe film were examined by TEM diffraction. The observed epitaxy is [111]CdTe//[001]Ni. The adjacent domains in CdTe film have a 30 rotation with respect to each other as inferred by the observed different diffraction patterns obtained from different zone axes. The high resolution lattice imaging shows that lamellar twins dominate within each domain. Our results are compared with CdTe(111) film epitaxially grown on Si(001) substrate by molecular beam epitaxy reported in the literature.

KW - Cadmium telluride film

KW - Cube-textured nickel sheet

KW - Epitaxy

KW - Lattice imaging

KW - Metal organic chemical vapor deposition

KW - Orientational domains

KW - Out-of-plane misalignment

KW - Transmission electron diffraction

UR - https://www.scopus.com/pages/publications/84875447684

U2 - 10.1016/j.tsf.2013.01.082

DO - 10.1016/j.tsf.2013.01.082

M3 - Article

AN - SCOPUS:84875447684

SN - 0040-6090

VL - 531

SP - 217

EP - 221

JO - Thin Solid Films

JF - Thin Solid Films

ER -

Orientational domains in metalorganic chemical vapor deposited CdTe(111) film on cube-textured Ni

Abstract

Keywords

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