Optical characterization of InP epitaxial layers on different substrates

K. L. Jiao; J. P. Zheng; H. S. Kwok; W. A. Anderson

doi:10.1117/12.24441

Optical characterization of InP epitaxial layers on different substrates

K. L. Jiao
, J. P. Zheng
, H. S. Kwok
, W. A. Anderson

Department of Electrical Engineering

SUNY Buffalo

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	776-783
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1361
Issue number	pt 2
DOIs	https://doi.org/10.1117/12.24441
State	Published - 1991
Event	Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization - Aachen, Ger Duration: Oct 28 1990 → Nov 2 1990

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@article{4973a25dc4774be197707d384612b3bd,

title = "Optical characterization of InP epitaxial layers on different substrates",

author = "Jiao, \{K. L.\} and Zheng, \{J. P.\} and Kwok, \{H. S.\} and Anderson, \{W. A.\}",

year = "1991",

doi = "10.1117/12.24441",

language = "English",

volume = "1361",

pages = "776--783",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

number = "pt 2",

note = "Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization ; Conference date: 28-10-1990 Through 02-11-1990",

}

TY - JOUR

T1 - Optical characterization of InP epitaxial layers on different substrates

AU - Jiao, K. L.

AU - Zheng, J. P.

AU - Kwok, H. S.

AU - Anderson, W. A.

PY - 1991

Y1 - 1991

UR - https://www.scopus.com/pages/publications/0025757479

U2 - 10.1117/12.24441

DO - 10.1117/12.24441

M3 - Conference article

AN - SCOPUS:0025757479

SN - 0277-786X

VL - 1361

SP - 776

EP - 783

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

IS - pt 2

T2 - Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization

Y2 - 28 October 1990 through 2 November 1990

ER -

Optical characterization of InP epitaxial layers on different substrates

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