Abstract
The effect of spacers in modulation-doped ZnCdSe/ZnSe:Cl multiple quantum wells (MD-MQW) grown by molecular beam epitaxy (MBE) was studied with photoluminescence (PL) and time-of-flight secondary-ion-mass spectrometry (TOF-SIMS) as a function of annealing temperature. PL is used to evaluate sample structures by providing information on their thermal stability in optical properties. TOF-SIMS monitors the diffusion profiles of elements.
| Original language | English |
|---|---|
| Pages (from-to) | 891-895 |
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 86 |
| Issue number | 2 |
| DOIs | |
| State | Published - 1999 |
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