Abstract
In this paper, we consider a one dimensional overlapping search strategy with finite length defect. We first develop the probabilistic model for the single finite length defect case. We then relax this assumption and construct the probabilistic model for the multiple finite length defects case. This latter model establishes an economic model for a visual inspection task based on a stopping time T.
| Original language | English |
|---|---|
| Pages | 107-112 |
| Number of pages | 6 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 6th Annual Industrial Engineering Research Conference, IERC - Miami Beach, FL, USA Duration: May 17 1997 → May 18 1997 |
Conference
| Conference | Proceedings of the 1997 6th Annual Industrial Engineering Research Conference, IERC |
|---|---|
| City | Miami Beach, FL, USA |
| Period | 05/17/97 → 05/18/97 |
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