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One dimensional overlapping systematic search with finite length defect

  • SUNY Buffalo

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

In this paper, we consider a one dimensional overlapping search strategy with finite length defect. We first develop the probabilistic model for the single finite length defect case. We then relax this assumption and construct the probabilistic model for the multiple finite length defects case. This latter model establishes an economic model for a visual inspection task based on a stopping time T.

Original languageEnglish
Pages107-112
Number of pages6
StatePublished - 1997
EventProceedings of the 1997 6th Annual Industrial Engineering Research Conference, IERC - Miami Beach, FL, USA
Duration: May 17 1997May 18 1997

Conference

ConferenceProceedings of the 1997 6th Annual Industrial Engineering Research Conference, IERC
CityMiami Beach, FL, USA
Period05/17/9705/18/97

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