On investigation of thermal deformations of laser diodes by the holographic interference microscopic method

L. E. Batay; I. M. Markhvida; A. N. Kuzmin; L. V. Tanin

doi:10.1016/0030-4018(86)90263-4

On investigation of thermal deformations of laser diodes by the holographic interference microscopic method

L. E. Batay
, I. M. Markhvida
, A. N. Kuzmin
, L. V. Tanin

Institute for Lasers Photonics and Biophotonics

Belarus Academy of Sciences

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Holographic interference microscopy has been used in an investigation of laser diodes. The interferogram contrast is shown to be dependent on the longitudinal shift of the sample. Experimental results are presented.

Original language	English
Pages (from-to)	307-310
Number of pages	4
Journal	Optics Communications
Volume	57
Issue number	5
DOIs	https://doi.org/10.1016/0030-4018(86)90263-4
State	Published - Apr 1 1986

Access to Document

10.1016/0030-4018(86)90263-4

Cite this

@article{30d9a659868d4b929e19ebbaaca5b77b,

title = "On investigation of thermal deformations of laser diodes by the holographic interference microscopic method",

abstract = "Holographic interference microscopy has been used in an investigation of laser diodes. The interferogram contrast is shown to be dependent on the longitudinal shift of the sample. Experimental results are presented.",

author = "Batay, \{L. E.\} and Markhvida, \{I. M.\} and Kuzmin, \{A. N.\} and Tanin, \{L. V.\}",

year = "1986",

month = apr,

day = "1",

doi = "10.1016/0030-4018(86)90263-4",

language = "English",

volume = "57",

pages = "307--310",

journal = "Optics Communications",

issn = "0030-4018",

publisher = "Elsevier B.V.",

number = "5",

}

TY - JOUR

T1 - On investigation of thermal deformations of laser diodes by the holographic interference microscopic method

AU - Batay, L. E.

AU - Markhvida, I. M.

AU - Kuzmin, A. N.

AU - Tanin, L. V.

PY - 1986/4/1

Y1 - 1986/4/1

N2 - Holographic interference microscopy has been used in an investigation of laser diodes. The interferogram contrast is shown to be dependent on the longitudinal shift of the sample. Experimental results are presented.

AB - Holographic interference microscopy has been used in an investigation of laser diodes. The interferogram contrast is shown to be dependent on the longitudinal shift of the sample. Experimental results are presented.

UR - https://www.scopus.com/pages/publications/0022698388

U2 - 10.1016/0030-4018(86)90263-4

DO - 10.1016/0030-4018(86)90263-4

M3 - Article

AN - SCOPUS:0022698388

SN - 0030-4018

VL - 57

SP - 307

EP - 310

JO - Optics Communications

JF - Optics Communications

IS - 5

ER -

On investigation of thermal deformations of laser diodes by the holographic interference microscopic method

Abstract

Access to Document

Other files and links

Fingerprint

Cite this