Abstract
We have fabricated ferromagnet-insulator-ferromagnet junctions using a ramp-edge geometry based on (La0.7Sr0.3)MnO3 ferromagnetic electrodes and a SrTiO3 insulator. Pulsed laser deposition was used to deposit the multilayer thin films and the devices were patterned using photolithography and ion milling. As expected from the spin-dependent tunneling, the junction magnetoresistance is dependent on the relative orientation of the magnetization in the electrodes. A junction magnetoresistance (JMR) as large as 30% is observed at low temperatures and low fields. In addition, we have found that JMR is reduced at high temperatures (T> 100 K) and decreases monotonically with increasing field at high fields (0.5 T<H< 1 T). Possible causes for these are also discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 7052-7054 |
| Number of pages | 3 |
| Journal | Journal of Applied Physics |
| Volume | 83 |
| Issue number | 11 |
| DOIs | |
| State | Published - 1998 |
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