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Noise measurement of YBa2Cu3O7-x and Ti2Ba2Ca2Cu3O10-x thin films

  • J. P. Zheng
  • , Q. Y. Ying
  • , S. Y. Dong
  • , H. S. Kwok
  • , S. H. Liou
  • SUNY Buffalo
  • University of Nebraska-Lincoln

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

The noise of YBa2Cu3O7-x and Tl 2Ba2Cr2Cu3O10-x thin films in the frequency range from 0.5 Hz to 100 kHz was studied. In the normal state, it was found that 1/f noise dominated, with a magnitude strongly dependent on temperature. In the superconducting state, the noise was only observable at frequencies below 5 Hz with our present setup. Equilibrium thermal fluctuation noise was not observed in these films.

Original languageEnglish
Pages (from-to)553-555
Number of pages3
JournalJournal of Applied Physics
Volume69
Issue number1
DOIs
StatePublished - 1991

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