New framework for generating optimal march tests for memory arrays

Given a set of memory array faults the problem of computing an optimal march test that detects all specified memory array faults is addressed. In this paper, we propose a novel approach in which every memory array fault is modeled by a set of primitive memory faults. A primitive march test is defined for each primitive memory fault. We show that march tests that detect the specified memory array faults are composed of primitive march tests. A method to compute the optimal march tests for the specified memory array faults is described. A set of examples to illustrate the approach is presented.