Skip to main navigation Skip to search Skip to main content

Negative terahertz dynamic conductivity in electrically induced lateral p-i-n junction in graphene

  • The University of Aizu
  • Rensselaer Polytechnic Institute

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We analyze a graphene tunneling transit-time device based on a heterostructure with a lateral p-i-n junction electrically induced in the graphene layer and calculate its ac characteristics. Using the developed device model, it is shown that the ballistic transit of electrons and holes generated due to interband tunneling in the i-section results in the negative ac conductance in the terahertz frequency range. The device can serve as an active element of terahertz oscillators.

Original languageEnglish
Pages (from-to)719-721
Number of pages3
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume42
Issue number4
DOIs
StatePublished - Feb 2010

Keywords

  • Dynamic conductivity
  • Graphene
  • Plasma oscillations
  • Terahertz radiation
  • Transit-time device
  • Tunneling

Fingerprint

Dive into the research topics of 'Negative terahertz dynamic conductivity in electrically induced lateral p-i-n junction in graphene'. Together they form a unique fingerprint.

Cite this