Abstract
Microfabricated cantilever beams promise to bring about a revolution in the field of chemical, physical, and biological sensor development. The resonance frequency of a microfabricated cantilever shifts sensitively because of mass loading from molecular adsorption. The minimum detectable adsorbed mass on a cantilever sensor can be increased by orders of magnitude by changing the dimensions of the device; smaller and thicker cantilevers offer higher resonance frequency and therefore better mass detection sensitivity. Here we describe micromachined silicon cantilevers that are 0.5 to 4 μm in length, fabricated with the use of a focused ion beam (FIB). In addition, we demonstrate a technique for detection of the cantilever resonance frequency that is based on electron transfer.
| Original language | English |
|---|---|
| Pages (from-to) | 369-373 |
| Number of pages | 5 |
| Journal | Journal of Nanoscience and Nanotechnology |
| Volume | 2 |
| Issue number | 3-4 |
| DOIs | |
| State | Published - Jun 2002 |
Keywords
- Electron Transfer
- Focused Ion Beam
- Micromachining
- Nanocantilevers
- Resonance Frequency
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