Abstract
We report on the intentional n-type doping of the diluted magnetic semiconductor Zn1-xMnxSe using ZnCl2 as the dopant source. Samples with varying Mn concentrations and carrier densities were grown by molecular beam epitaxy and characterized using Hall effect, x-ray diffraction, and photoluminescence measurements. Net carrier concentrations in excess of 1018cm-3 are readily obtained for x≤0.08. Useful carrier densities can be achieved for Mn concentrations x≤0.15, above which the samples are highly insulating. The controlled doping of this alloy provides another material for use in the fabrication of wide gap semiconductor device structures.
| Original language | English |
|---|---|
| Pages (from-to) | 2412 |
| Number of pages | 1 |
| Journal | Applied Physics Letters |
| DOIs | |
| State | Published - 1995 |
Fingerprint
Dive into the research topics of 'N-type doping of the diluted magnetic semiconductor Zn1-xMnxSe'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver