Abstract
The two-photon confocal scanning microscopy was discussed using a femtosecond chromium-forsterite laser with output wavelength centered at 1220-1240 nanometers. The high axial/depth discrimination in axial resolution was achieved by the combination of two-photon induced fluorescence with laser scanning microscopy. The quadratic dependence of the two-photon absorption on the laser intensity provided the opportunity to image thicker samples. The images taken by chromium-forsterite laser were compared with those by titanium-sapphire laser.
| Original language | English |
|---|---|
| Pages | 97 |
| Number of pages | 1 |
| State | Published - 2000 |
| Event | 2000 Confernce on Lasers and Electro-Optics Europe (CLEO 2000) - Nice, France Duration: Sep 10 2000 → Sep 15 2000 |
Conference
| Conference | 2000 Confernce on Lasers and Electro-Optics Europe (CLEO 2000) |
|---|---|
| City | Nice, France |
| Period | 09/10/00 → 09/15/00 |
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