Skip to main navigation Skip to search Skip to main content

Models for plasmonic THz detectors based on graphene split-gate FETs with lateral p-n junctions

  • Maxim Ryzhii
  • , Victor Ryzhii
  • , Akira Satou
  • , Taiichi Otsuji
  • , Vladimir Mitin
  • , Michael S. Shur
  • The University of Aizu
  • Tohoku University
  • Russian Academy of Sciences
  • Rensselaer Polytechnic Institute

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose and analyze the resonant plasmonic terahertz detectors based on the split-gate field-effect transistors with electrically induced p-n junctions and graphene and perforated graphene channels. The perforation of the p-n junction depletion region leads to the tunneling suppression and the substantial reinforcement of the detector resonant response.

Original languageEnglish
Title of host publication2016 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2016
EditorsPeter Pichler, Eberhard Bar, Jurgen Lorenz
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages361-364
Number of pages4
ISBN (Electronic)9781509008179
DOIs
StatePublished - Oct 20 2016
Event2016 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2016 - Nuremberg, Germany
Duration: Sep 6 2016Sep 8 2016

Publication series

NameInternational Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Conference

Conference2016 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2016
Country/TerritoryGermany
CityNuremberg
Period09/6/1609/8/16

Fingerprint

Dive into the research topics of 'Models for plasmonic THz detectors based on graphene split-gate FETs with lateral p-n junctions'. Together they form a unique fingerprint.

Cite this