Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence

S. Kim; Y. L. Soo; G. Kioseoglou; Y. H. Kao; A. D. Compaan

doi:10.1063/1.1755852

Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence

S. Kim
, Y. L. Soo
, G. Kioseoglou
, Y. H. Kao
, A. D. Compaan

Physics

SUNY Buffalo
University of Toledo

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

A quantitative study of the Te depth profile and structural changes in a series of CdS/CdTe heterojuctions annealed at various temperatures by employing X-ray reflectivity and angular dependence of X-ray fluorescence (ADXRF) was presented. The temperature dependence of surface roughening and Te migration was observed in reflectivity and flourescence experiments. It was found that the changes in the interface morphology and Te distribution were quantified by detailed analysis of the angular dependence of x-ray fluorescene (ADXFR) data with the aid of reflectivity measurements. The results showed that a large amount of Te up to 50% could migrate into the CdS layer.

Original language	English
Pages (from-to)	1007-1012
Number of pages	6
Journal	Journal of Applied Physics
Volume	96
Issue number	2
DOIs	https://doi.org/10.1063/1.1755852
State	Published - Jul 15 2004

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title = "Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence",

abstract = "A quantitative study of the Te depth profile and structural changes in a series of CdS/CdTe heterojuctions annealed at various temperatures by employing X-ray reflectivity and angular dependence of X-ray fluorescence (ADXRF) was presented. The temperature dependence of surface roughening and Te migration was observed in reflectivity and flourescence experiments. It was found that the changes in the interface morphology and Te distribution were quantified by detailed analysis of the angular dependence of x-ray fluorescene (ADXFR) data with the aid of reflectivity measurements. The results showed that a large amount of Te up to 50\% could migrate into the CdS layer.",

author = "S. Kim and Soo, \{Y. L.\} and G. Kioseoglou and Kao, \{Y. H.\} and Compaan, \{A. D.\}",

year = "2004",

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doi = "10.1063/1.1755852",

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TY - JOUR

T1 - Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence

AU - Kim, S.

AU - Soo, Y. L.

AU - Kioseoglou, G.

AU - Kao, Y. H.

AU - Compaan, A. D.

PY - 2004/7/15

Y1 - 2004/7/15

N2 - A quantitative study of the Te depth profile and structural changes in a series of CdS/CdTe heterojuctions annealed at various temperatures by employing X-ray reflectivity and angular dependence of X-ray fluorescence (ADXRF) was presented. The temperature dependence of surface roughening and Te migration was observed in reflectivity and flourescence experiments. It was found that the changes in the interface morphology and Te distribution were quantified by detailed analysis of the angular dependence of x-ray fluorescene (ADXFR) data with the aid of reflectivity measurements. The results showed that a large amount of Te up to 50% could migrate into the CdS layer.

AB - A quantitative study of the Te depth profile and structural changes in a series of CdS/CdTe heterojuctions annealed at various temperatures by employing X-ray reflectivity and angular dependence of X-ray fluorescence (ADXRF) was presented. The temperature dependence of surface roughening and Te migration was observed in reflectivity and flourescence experiments. It was found that the changes in the interface morphology and Te distribution were quantified by detailed analysis of the angular dependence of x-ray fluorescene (ADXFR) data with the aid of reflectivity measurements. The results showed that a large amount of Te up to 50% could migrate into the CdS layer.

UR - https://www.scopus.com/pages/publications/3242671811

U2 - 10.1063/1.1755852

DO - 10.1063/1.1755852

M3 - Article

AN - SCOPUS:3242671811

SN - 0021-8979

VL - 96

SP - 1007

EP - 1012

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 2

ER -

Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence

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