Skip to main navigation Skip to search Skip to main content

Microwave surface resistance of yba2cu3o7-δ films on polycrystalline alumina and ni-based alloy substrates with ion-beam-assisted-deposited buffer layers

  • A. T. Findikoglu
  • , P. N. Arendt
  • , J. R. Groves
  • , S. R. Foltyn
  • , E. J. Peterson
  • , D. W. Reagor
  • , Q. X. Jia
  • Los Alamos National Laboratory Materials Science and Technology Division

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We measured the microwave surface resistance Rs of superconducting YBa2Cu3O7-x (YBCO) films on buffered polycrystalline alumina and Ni-based alloy substrates using a parallel-plate resonator technique. We observed a strong correlation between the low-power Rs and the in-plane mosaic spread of the YBCO films. A 0.4-μm-thick YBCO film with an in-plane mosaic spread of 6.6° (7°) on a buffered polycrystalline Ni-based alloy (buffered polycrystalline alumina) substrate showed an Rs of 0.51 mΩ (1.89 mΩ) at 76 K and 0.17 mΩ (0.21 mΩ) at 4 K.

Original languageEnglish
Pages (from-to)1232-1235
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume7
Issue number2 PART 2
DOIs
StatePublished - 1997

Fingerprint

Dive into the research topics of 'Microwave surface resistance of yba2cu3o7-δ films on polycrystalline alumina and ni-based alloy substrates with ion-beam-assisted-deposited buffer layers'. Together they form a unique fingerprint.

Cite this