Microstructural evolution with the change in thickness of superconducting films

Q. X. Jia; H. Wang; Y. Lin; Y. Li; C. Wetteland; G. W. Brown; M. Hawley; B. Maiorov; S. R. Foltyn; L. Civale; P. N. Arendt; J. L. MacManus-Driscoll

doi:10.1109/TASC.2007.898941

Microstructural evolution with the change in thickness of superconducting films

Q. X. Jia
, H. Wang
, Y. Lin
, Y. Li
, C. Wetteland
, G. W. Brown
, M. Hawley
, B. Maiorov
, S. R. Foltyn
, L. Civale
, P. N. Arendt
, J. L. MacManus-Driscoll

Department of Materials Design and Innovation

Los Alamos National Laboratory
University of Cambridge

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

Microstructural evolution with the change in thickness of superconducting YBa₂Cu₃O_7-x films on single-crystal SrTiO ₃ substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.

Original language	English
Pages (from-to)	3243-3246
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	17
Issue number	2
DOIs	https://doi.org/10.1109/TASC.2007.898941
State	Published - Jun 2007

Keywords

Conductors
High-temperature superconductors
Thick films
Thin films

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10.1109/TASC.2007.898941

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title = "Microstructural evolution with the change in thickness of superconducting films",

abstract = "Microstructural evolution with the change in thickness of superconducting YBa2Cu3O7-x films on single-crystal SrTiO 3 substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.",

keywords = "Conductors, High-temperature superconductors, Thick films, Thin films",

author = "Jia, \{Q. X.\} and H. Wang and Y. Lin and Y. Li and C. Wetteland and Brown, \{G. W.\} and M. Hawley and B. Maiorov and Foltyn, \{S. R.\} and L. Civale and Arendt, \{P. N.\} and MacManus-Driscoll, \{J. L.\}",

year = "2007",

month = jun,

doi = "10.1109/TASC.2007.898941",

language = "English",

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pages = "3243--3246",

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T1 - Microstructural evolution with the change in thickness of superconducting films

AU - Jia, Q. X.

AU - Wang, H.

AU - Lin, Y.

AU - Li, Y.

AU - Wetteland, C.

AU - Brown, G. W.

AU - Hawley, M.

AU - Maiorov, B.

AU - Foltyn, S. R.

AU - Civale, L.

AU - Arendt, P. N.

AU - MacManus-Driscoll, J. L.

PY - 2007/6

Y1 - 2007/6

N2 - Microstructural evolution with the change in thickness of superconducting YBa2Cu3O7-x films on single-crystal SrTiO 3 substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.

AB - Microstructural evolution with the change in thickness of superconducting YBa2Cu3O7-x films on single-crystal SrTiO 3 substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.

KW - Conductors

KW - High-temperature superconductors

KW - Thick films

KW - Thin films

UR - https://www.scopus.com/pages/publications/34547444471

U2 - 10.1109/TASC.2007.898941

DO - 10.1109/TASC.2007.898941

M3 - Article

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SP - 3243

EP - 3246

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 2

ER -

Microstructural evolution with the change in thickness of superconducting films

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Keywords

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