Martensitic transformation in Ni50Ti50 films

Quanmin Su; Susan Z. Hua; Manfred Wuttig

doi:10.1117/12.174077

Martensitic transformation in Ni₅₀Ti₅₀ films

Quanmin Su
, Susan Z. Hua
, Manfred Wuttig

Department of Mechanical and Aerospace Engineering

University of Maryland, College Park

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

The elasticity and anelasticity of Ni₅₀Ti₅₀ films deposited on Si substrates was studied yielding information on the damping and modulus softening. It was found that the transformation behavior strongly depends on the film thickness and approaches bulk Ni₅₀Ti₅₀ behavior as the film becomes a few μm thick. For the same film thickness, the transformadon depends on the film/substrate adhesion. In films with good adhesion cross sectional Transmission Electron Microscopy (TEM) reveals a thin parent phase layer which does not transform while the bulk part of me Ni₅₀Ti₅₀ film transforms. It is thus proposed that interface constraints stabilize the B2 structure. A microscopic interpretadon in terms of transformation strains at the interface is given.

Original language	English
Pages (from-to)	409-412
Number of pages	4
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2189
DOIs	https://doi.org/10.1117/12.174077
State	Published - May 1 1994
Event	1994 North American Conference on Smart Structures and Materials: Smart Materials - Orlando, United States Duration: Feb 13 1994 → Feb 18 1994

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@article{af146123ddd943e89cad55cc0fac8fb6,

title = "Martensitic transformation in Ni50Ti50 films",

abstract = "The elasticity and anelasticity of Ni50Ti50 films deposited on Si substrates was studied yielding information on the damping and modulus softening. It was found that the transformation behavior strongly depends on the film thickness and approaches bulk Ni50Ti50 behavior as the film becomes a few μm thick. For the same film thickness, the transformadon depends on the film/substrate adhesion. In films with good adhesion cross sectional Transmission Electron Microscopy (TEM) reveals a thin parent phase layer which does not transform while the bulk part of me Ni50Ti50 film transforms. It is thus proposed that interface constraints stabilize the B2 structure. A microscopic interpretadon in terms of transformation strains at the interface is given.",

author = "Quanmin Su and Hua, \{Susan Z.\} and Manfred Wuttig",

note = "Publisher Copyright: {\textcopyright} 1994 SPIE. All rights reserved.; 1994 North American Conference on Smart Structures and Materials: Smart Materials ; Conference date: 13-02-1994 Through 18-02-1994",

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doi = "10.1117/12.174077",

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TY - JOUR

T1 - Martensitic transformation in Ni50Ti50 films

AU - Su, Quanmin

AU - Hua, Susan Z.

AU - Wuttig, Manfred

PY - 1994/5/1

Y1 - 1994/5/1

N2 - The elasticity and anelasticity of Ni50Ti50 films deposited on Si substrates was studied yielding information on the damping and modulus softening. It was found that the transformation behavior strongly depends on the film thickness and approaches bulk Ni50Ti50 behavior as the film becomes a few μm thick. For the same film thickness, the transformadon depends on the film/substrate adhesion. In films with good adhesion cross sectional Transmission Electron Microscopy (TEM) reveals a thin parent phase layer which does not transform while the bulk part of me Ni50Ti50 film transforms. It is thus proposed that interface constraints stabilize the B2 structure. A microscopic interpretadon in terms of transformation strains at the interface is given.

AB - The elasticity and anelasticity of Ni50Ti50 films deposited on Si substrates was studied yielding information on the damping and modulus softening. It was found that the transformation behavior strongly depends on the film thickness and approaches bulk Ni50Ti50 behavior as the film becomes a few μm thick. For the same film thickness, the transformadon depends on the film/substrate adhesion. In films with good adhesion cross sectional Transmission Electron Microscopy (TEM) reveals a thin parent phase layer which does not transform while the bulk part of me Ni50Ti50 film transforms. It is thus proposed that interface constraints stabilize the B2 structure. A microscopic interpretadon in terms of transformation strains at the interface is given.

UR - https://www.scopus.com/pages/publications/34447334146

U2 - 10.1117/12.174077

DO - 10.1117/12.174077

M3 - Conference article

AN - SCOPUS:34447334146

SN - 0277-786X

VL - 2189

SP - 409

EP - 412

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - 1994 North American Conference on Smart Structures and Materials: Smart Materials

Y2 - 13 February 1994 through 18 February 1994

ER -

Martensitic transformation in Ni₅₀Ti₅₀ films

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