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Magnetoreflectivity study of excitons in Zn1−xFexSe epilayers (abstract)

  • X. Liu
  • , A. Petrou
  • , G. A. Prinz
  • , B. T. Jonker
  • , J. J. Krebs
  • , J. Warnock
  • SUNY Buffalo
  • Naval Research Laboratory
  • IBM

Research output: Contribution to journalArticlepeer-review

Abstract

We have performed a magnetoreflectivity study of excitons in epilayers of the diluted magnetic semiconductor Zn1−xFexSe. The samples were grown by molecular‐beam epitaxy on GaAs (100) substrates to a typical thickness of 1 μm. Using both Faraday and Voigt geometries and magnetic spin splittings of the conduction and valence bands. The band splitting was found to be linear in magnetic field B and B<6 T. We measure effective g factors of 33.4 and 28.3 for the conduction and valence bands, respectively. For fields B>6 T, deviations were observed. The band spin splitting was also studied as a function of temperature at constant fields. At low temperatures, the spin splitting is independent of temperature. These data are in agreement with previous magnetization studies1 which showed that ZnFeSe, unlike Mn‐based diluted magnetic semiconductors, exhibits Van Vleck paramagnetism. The temperature study of the band splitting allowed a determination of the crystal field splitting.

Original languageEnglish
Pages (from-to)3309
Number of pages1
JournalJournal of Applied Physics
Volume63
Issue number8
DOIs
StatePublished - Apr 15 1988

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