Abstract
The growth of (In,Mn)As thin films with a thickness 300-600 nm was discussed using organometallic vapor phase epitaxy (OMVPE). It was observed that these films showed ferromagnetism above room temperature. Extended x-ray absorption fine structure (EXAFS) technique was used to analyze the local structure around Mn atoms in thin films. A short-range order was observed for InMnAs prepared by the OMVPE process compared to that of the molecular beam epitaxy (MBE) deposited films.
| Original language | English |
|---|---|
| Pages (from-to) | 481-483 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jan 26 2004 |
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