Skip to main navigation Skip to search Skip to main content

Local structure around Fe in the diluted magnetic semiconductors Ga1−xFexAs studied by x-ray absorption fine structure

  • Y. L. Soo
  • , G. Kioseoglou
  • , S. Huang
  • , S. Kim
  • , Y. H. Kao
  • SUNY Buffalo
  • Institute of Science Tokyo

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

Extended x-ray absorption fine structure and near-edge x-ray absorption fine structure techniques are employed to investigate the local structure and valency about Fe atoms in the diluted magnetic alloy semiconductor system Ga1−xFexAs prepared by molecular-beam epitaxy under various conditions. This experiment is aimed at elucidating possible correlations between the microstructures in these diluted magnetic semiconductors and some physical properties. Our x-ray results offer direct evidence of Fe substitution for Ga sites in GaAs prepared at relatively low substrate temperatures, wherein the Ga1−xFexAs compound is mainly paramagnetic. However, the Fe impurity atoms could form small Fe clusters and/or Fe-As complexes when the samples are grown at high temperatures.

Original languageEnglish
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume63
Issue number19
DOIs
StatePublished - May 1 2001

Fingerprint

Dive into the research topics of 'Local structure around Fe in the diluted magnetic semiconductors Ga1−xFexAs studied by x-ray absorption fine structure'. Together they form a unique fingerprint.

Cite this