Line-shape analysis of reflectance spectra from GaAs/AlAs multiple-quantum-well structures

A. F. Terzis; X. C. Liu; A. Petrou; B. D. McCombe; M. Dutta; H. Shen; Doran D. Smith; M. W. Cole; M. Taysing-Lara; P. G. Newman

doi:10.1063/1.345501

Line-shape analysis of reflectance spectra from GaAs/AlAs multiple-quantum-well structures

A. F. Terzis
, X. C. Liu
, A. Petrou
, B. D. McCombe
, M. Dutta
, H. Shen
, Doran D. Smith
, M. W. Cole
, M. Taysing-Lara
, P. G. Newman

Physics

SUNY Buffalo
U.S. Army Research Laboratory

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

The reflectance spectra from six GaAs/AlAs multiple-quantum-well structures have been analyzed with a multilayer classical dielectric function model which describes in detail the propagation of light through these microstructures. The model predicts accurately the observed line shapes. It can be used for the analysis of the reflectance or transmission spectra of any semiconductor multilayer structure.

Original language	English
Pages (from-to)	2501-2505
Number of pages	5
Journal	Journal of Applied Physics
Volume	67
Issue number	5
DOIs	https://doi.org/10.1063/1.345501
State	Published - 1990

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10.1063/1.345501

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title = "Line-shape analysis of reflectance spectra from GaAs/AlAs multiple-quantum-well structures",

abstract = "The reflectance spectra from six GaAs/AlAs multiple-quantum-well structures have been analyzed with a multilayer classical dielectric function model which describes in detail the propagation of light through these microstructures. The model predicts accurately the observed line shapes. It can be used for the analysis of the reflectance or transmission spectra of any semiconductor multilayer structure.",

author = "Terzis, \{A. F.\} and Liu, \{X. C.\} and A. Petrou and McCombe, \{B. D.\} and M. Dutta and H. Shen and Smith, \{Doran D.\} and Cole, \{M. W.\} and M. Taysing-Lara and Newman, \{P. G.\}",

year = "1990",

doi = "10.1063/1.345501",

language = "English",

volume = "67",

pages = "2501--2505",

journal = "Journal of Applied Physics",

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T1 - Line-shape analysis of reflectance spectra from GaAs/AlAs multiple-quantum-well structures

AU - Terzis, A. F.

AU - Liu, X. C.

AU - Petrou, A.

AU - McCombe, B. D.

AU - Dutta, M.

AU - Shen, H.

AU - Smith, Doran D.

AU - Cole, M. W.

AU - Taysing-Lara, M.

AU - Newman, P. G.

PY - 1990

Y1 - 1990

N2 - The reflectance spectra from six GaAs/AlAs multiple-quantum-well structures have been analyzed with a multilayer classical dielectric function model which describes in detail the propagation of light through these microstructures. The model predicts accurately the observed line shapes. It can be used for the analysis of the reflectance or transmission spectra of any semiconductor multilayer structure.

AB - The reflectance spectra from six GaAs/AlAs multiple-quantum-well structures have been analyzed with a multilayer classical dielectric function model which describes in detail the propagation of light through these microstructures. The model predicts accurately the observed line shapes. It can be used for the analysis of the reflectance or transmission spectra of any semiconductor multilayer structure.

UR - https://www.scopus.com/pages/publications/0001145530

U2 - 10.1063/1.345501

DO - 10.1063/1.345501

M3 - Article

AN - SCOPUS:0001145530

SN - 0021-8979

VL - 67

SP - 2501

EP - 2505

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

ER -

Line-shape analysis of reflectance spectra from GaAs/AlAs multiple-quantum-well structures

Abstract

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