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Leakage mechanisms of self-assembled (BiFeO3) 0.5:(Sm2O3)0.5 nanocomposite films

  • H. Yang
  • , H. Wang
  • , G. F. Zou
  • , M. Jain
  • , N. A. Suvorova
  • , D. M. Feldmann
  • , P. C. Dowden
  • , R. F. DePaula
  • , J. L. MacManus-Driscoll
  • , A. J. Taylor
  • , Q. X. Jia
  • Los Alamos National Laboratory
  • Texas A&M University
  • University of Cambridge

Research output: Contribution to journalArticlepeer-review

68 Scopus citations

Abstract

Nanocomposite (BiFeO3)0.5: (Sm2O 3)0.5 films were deposited on (001) oriented Nb-doped SrTiO3 substrates by pulsed laser deposition. The leakage current density versus electric field characteristics were investigated and compared with those of as-deposited and annealed pure BiFeO3 (BFO) thin films. The dominant leakage mechanisms of nanocomposite films were space-charge-limited current and Poole-Frenkle emission for positive and negative biases, respectively. The leakage current density of nanocomposite films was reduced three orders of magnitude in comparison with the as-deposited pure BFO films. The less oxygen vacancies in the BFO phase in the nanocomposite is believed to contribute to the leakage reduction.

Original languageEnglish
Article number142904
JournalApplied Physics Letters
Volume93
Issue number14
DOIs
StatePublished - 2008

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