Laser patterning and critical current measurements of submicrometer lines of Y-Ba-Cu-O

J. P. Zheng; H. S. Kim; Q. Y. Ying; R. Barone; P. Bush; D. T. Shaw; H. S. Kwok

doi:10.1063/1.101726

Laser patterning and critical current measurements of submicrometer lines of Y-Ba-Cu-O

J. P. Zheng
, H. S. Kim
, Q. Y. Ying
, R. Barone
, P. Bush
, D. T. Shaw
, H. S. Kwok

SUNY Buffalo

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

Superconducting strips of 0.6 μm width were fabricated by direct laser writing on mirror-like Y-Ba-Cu-O thin films on various substrates. These films were grown by laser deposition without post-annealing. Laser ablation etching had no effect on the T_c and J_c until the lines were <1 μm wide. The 0.6-μm-wide strip showed some degradation of T_c. The critical current densities for all patterned lines were measured to be ∼4×10⁶ A/cm² at 20 °K.

Original language	English
Pages (from-to)	1044-1046
Number of pages	3
Journal	Applied Physics Letters
Volume	55
Issue number	10
DOIs	https://doi.org/10.1063/1.101726
State	Published - 1989

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@article{303948bfac064fa1bbca6be03c7db578,

title = "Laser patterning and critical current measurements of submicrometer lines of Y-Ba-Cu-O",

abstract = "Superconducting strips of 0.6 μm width were fabricated by direct laser writing on mirror-like Y-Ba-Cu-O thin films on various substrates. These films were grown by laser deposition without post-annealing. Laser ablation etching had no effect on the Tc and Jc until the lines were <1 μm wide. The 0.6-μm-wide strip showed some degradation of Tc. The critical current densities for all patterned lines were measured to be ∼4×106 A/cm2 at 20 °K.",

author = "Zheng, \{J. P.\} and Kim, \{H. S.\} and Ying, \{Q. Y.\} and R. Barone and P. Bush and Shaw, \{D. T.\} and Kwok, \{H. S.\}",

year = "1989",

doi = "10.1063/1.101726",

language = "English",

volume = "55",

pages = "1044--1046",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "10",

}

TY - JOUR

T1 - Laser patterning and critical current measurements of submicrometer lines of Y-Ba-Cu-O

AU - Zheng, J. P.

AU - Kim, H. S.

AU - Ying, Q. Y.

AU - Barone, R.

AU - Bush, P.

AU - Shaw, D. T.

AU - Kwok, H. S.

PY - 1989

Y1 - 1989

N2 - Superconducting strips of 0.6 μm width were fabricated by direct laser writing on mirror-like Y-Ba-Cu-O thin films on various substrates. These films were grown by laser deposition without post-annealing. Laser ablation etching had no effect on the Tc and Jc until the lines were <1 μm wide. The 0.6-μm-wide strip showed some degradation of Tc. The critical current densities for all patterned lines were measured to be ∼4×106 A/cm2 at 20 °K.

AB - Superconducting strips of 0.6 μm width were fabricated by direct laser writing on mirror-like Y-Ba-Cu-O thin films on various substrates. These films were grown by laser deposition without post-annealing. Laser ablation etching had no effect on the Tc and Jc until the lines were <1 μm wide. The 0.6-μm-wide strip showed some degradation of Tc. The critical current densities for all patterned lines were measured to be ∼4×106 A/cm2 at 20 °K.

UR - https://www.scopus.com/pages/publications/0013368143

U2 - 10.1063/1.101726

DO - 10.1063/1.101726

M3 - Article

AN - SCOPUS:0013368143

SN - 0003-6951

VL - 55

SP - 1044

EP - 1046

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 10

ER -

Laser patterning and critical current measurements of submicrometer lines of Y-Ba-Cu-O

Abstract

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