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Knowledge-Guided Semantics Adjustment for Improved Few-Shot Classification

  • University of Virginia

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

In few-shot image classification, it is challenging for deep neural networks to infer the true class of an image when it contains multiple class-unrelated objects and its label carries no semantic meanings, such as Class 1 or Class 2. In contrast, knowing what are not important in a typical classification task, humans can quickly identify the right class objects with very few images. In this paper, we propose to extract semantic features from a given dataset to filter out class-unrelated objects in a few-shot task. Each semantic feature is meta-learned and represents a common object or pattern shared by many tasks. The strengths of these features in a given image are adjusted by an importance kernel encoding the meta-learned knowledge such that class-unrelated objects can be suppressed, and the few-shot classification performance can be improved. To facilitate learning and identifying semantic features in an image, we further propose an image representation decomposition module to decouple complex correlations between objects in an image embedding. The experimental analysis demonstrates the effectiveness of our method, especially in the extremely low-shot cases.

Original languageEnglish
Title of host publicationProceedings - 22nd IEEE International Conference on Data Mining, ICDM 2022
EditorsXingquan Zhu, Sanjay Ranka, My T. Thai, Takashi Washio, Xindong Wu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1347-1352
Number of pages6
ISBN (Electronic)9781665450997
DOIs
StatePublished - 2022
Event22nd IEEE International Conference on Data Mining, ICDM 2022 - Orlando, United States
Duration: Nov 28 2022 → Dec 1 2022

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
Volume2022-November
ISSN (Electronic)2374-8486

Conference

Conference22nd IEEE International Conference on Data Mining, ICDM 2022
Country/TerritoryUnited States
CityOrlando
Period11/28/22 → 12/1/22

Keywords

  • few-shot classification
  • meta-learning
  • semantic features

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