Investigation of surface recombination processes of semiconducting materials using ultrafast laser assisted atom probe tomography

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	European Quantum Electronics Conference, EQEC 2011
State	Published - 2011
Event	European Quantum Electronics Conference, EQEC 2011 - Munich, Germany Duration: May 22 2011 → May 26 2011

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference	European Quantum Electronics Conference, EQEC 2011
Country/Territory	Germany
City	Munich
Period	05/22/11 → 05/26/11

Cite this

@inproceedings{62ca110a71eb432583728008361c01c6,

title = "Investigation of surface recombination processes of semiconducting materials using ultrafast laser assisted atom probe tomography",

author = "B. Mazumder and F. Vurpillot and A. Vella and B. Deconihout and G. Martel",

year = "2011",

language = "English",

isbn = "9781457705328",

series = "Optics InfoBase Conference Papers",

booktitle = "European Quantum Electronics Conference, EQEC 2011",

note = "European Quantum Electronics Conference, EQEC 2011 ; Conference date: 22-05-2011 Through 26-05-2011",

}

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Investigation of surface recombination processes of semiconducting materials using ultrafast laser assisted atom probe tomography

AU - Mazumder, B.

AU - Vurpillot, F.

AU - Vella, A.

AU - Deconihout, B.

AU - Martel, G.

PY - 2011

Y1 - 2011

UR - https://www.scopus.com/pages/publications/84893555811

M3 - Conference contribution

AN - SCOPUS:84893555811

SN - 9781457705328

T3 - Optics InfoBase Conference Papers

BT - European Quantum Electronics Conference, EQEC 2011

T2 - European Quantum Electronics Conference, EQEC 2011

Y2 - 22 May 2011 through 26 May 2011

ER -