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Investigation of surface flashover on dielectrics enhanced by excimer laser processing

  • W. J. Sarjeant
  • , J. Zirnheld
  • , J. Berkow
  • , P. Strzempka
  • , J. Cieri
  • , N. Chokshi
  • SUNY Buffalo
  • AMBP Tech Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

One of the factors that contributes to surface flashover on dielectrics is the existence of defects on the surface of the material. For our studies, excimer laser processing was utilized on alumina dielectrics in an attempt to substantially increase the threshold voltages for flashover. Through excimer laser processing, the surface material melts and re-crystallizes to form a uniform surface structure. The defects on the dielectric surface can be minimized, reducing charge trapping, leading to higher flashover voltages. Two sets of samples were tested. The first set of samples was processed using the laser and the second set was not. The samples were then stressed under high voltage to induce surface flashover. Analysis of the effects of the excimer laser processing was performed and are shown.

Original languageEnglish
Title of host publication2006 IEEE International Power Modulator Conference, IPMC(27th Power Modulator Symposium and 2006 High Voltage Workshop)
Pages81-85
Number of pages5
DOIs
StatePublished - 2006
Event2006 IEEE International Power Modulator Conference, IPMC(27th Power Modulator Symposium and 2006 High Voltage Workshop) - Washington, DC, United States
Duration: May 14 2006May 18 2006

Publication series

NameConference Record of the International Power Modulator Symposium and High Voltage Workshop
ISSN (Print)1076-8467

Conference

Conference2006 IEEE International Power Modulator Conference, IPMC(27th Power Modulator Symposium and 2006 High Voltage Workshop)
Country/TerritoryUnited States
CityWashington, DC
Period05/14/0605/18/06

Keywords

  • Alumina
  • Ceramic insulation
  • Electric breakdown
  • Flashover
  • Partial discharges
  • Scanning electron microscopy

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