Investigation of polyethylene oxide secondary and tertiary structure on ion formation in TOF-SIMS: Effects of end group chemistry and molecular weight distribution

Wenyan Yan; Joseph A. Gardella

Investigation of polyethylene oxide secondary and tertiary structure on ion formation in TOF-SIMS: Effects of end group chemistry and molecular weight distribution

Wenyan Yan
, Joseph A. Gardella

Chemistry

SUNY Buffalo

Research output: Contribution to journal › Conference article › peer-review

Abstract

The Langmuir-Blodgett method was utilized in the preparation of polyethylene oxide monolayer films on silver-silicon substrates. The effects of end group functionality and molecular weight distribution on the molecular structure of the films were monitored using reflection-absorption Fourier transform infrared spectroscopy (RA-FTIR) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). The differences in the RA-FTIR spectra suggest the existence of different structural conformations caused by the different end group chemistry having different degrees of crystallization.

Original language	English
Pages (from-to)	807-808
Number of pages	2
Journal	American Chemical Society, Polymer Preprints, Division of Polymer Chemistry
Volume	37
Issue number	2
State	Published - Aug 1996
Event	Proceedings of the 1996 ACS Orlando Meeting - Orlando, FL, USA Duration: Aug 25 1996 → Aug 29 1996

Cite this

@article{c60309f1553f46b99df271b672b58480,

title = "Investigation of polyethylene oxide secondary and tertiary structure on ion formation in TOF-SIMS: Effects of end group chemistry and molecular weight distribution",

abstract = "The Langmuir-Blodgett method was utilized in the preparation of polyethylene oxide monolayer films on silver-silicon substrates. The effects of end group functionality and molecular weight distribution on the molecular structure of the films were monitored using reflection-absorption Fourier transform infrared spectroscopy (RA-FTIR) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). The differences in the RA-FTIR spectra suggest the existence of different structural conformations caused by the different end group chemistry having different degrees of crystallization.",

author = "Wenyan Yan and Gardella, \{Joseph A.\}",

year = "1996",

month = aug,

language = "English",

volume = "37",

pages = "807--808",

journal = "American Chemical Society, Polymer Preprints, Division of Polymer Chemistry",

issn = "0032-3934",

number = "2",

note = "Proceedings of the 1996 ACS Orlando Meeting ; Conference date: 25-08-1996 Through 29-08-1996",

}

Investigation of polyethylene oxide secondary and tertiary structure on ion formation in TOF-SIMS: Effects of end group chemistry and molecular weight distribution. / Yan, Wenyan; Gardella, Joseph A.
In: American Chemical Society, Polymer Preprints, Division of Polymer Chemistry, Vol. 37, No. 2, 08.1996, p. 807-808.

Research output: Contribution to journal › Conference article › peer-review

TY - JOUR

T1 - Investigation of polyethylene oxide secondary and tertiary structure on ion formation in TOF-SIMS

T2 - Proceedings of the 1996 ACS Orlando Meeting

AU - Yan, Wenyan

AU - Gardella, Joseph A.

PY - 1996/8

Y1 - 1996/8

N2 - The Langmuir-Blodgett method was utilized in the preparation of polyethylene oxide monolayer films on silver-silicon substrates. The effects of end group functionality and molecular weight distribution on the molecular structure of the films were monitored using reflection-absorption Fourier transform infrared spectroscopy (RA-FTIR) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). The differences in the RA-FTIR spectra suggest the existence of different structural conformations caused by the different end group chemistry having different degrees of crystallization.

AB - The Langmuir-Blodgett method was utilized in the preparation of polyethylene oxide monolayer films on silver-silicon substrates. The effects of end group functionality and molecular weight distribution on the molecular structure of the films were monitored using reflection-absorption Fourier transform infrared spectroscopy (RA-FTIR) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). The differences in the RA-FTIR spectra suggest the existence of different structural conformations caused by the different end group chemistry having different degrees of crystallization.

UR - https://www.scopus.com/pages/publications/0030204703

M3 - Conference article

AN - SCOPUS:0030204703

SN - 0032-3934

VL - 37

SP - 807

EP - 808

JO - American Chemical Society, Polymer Preprints, Division of Polymer Chemistry

JF - American Chemical Society, Polymer Preprints, Division of Polymer Chemistry

IS - 2

Y2 - 25 August 1996 through 29 August 1996

ER -

Investigation of polyethylene oxide secondary and tertiary structure on ion formation in TOF-SIMS: Effects of end group chemistry and molecular weight distribution

Abstract

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