Skip to main navigation Skip to search Skip to main content

Intervalley coupling for interface-bound electrons in silicon: An effective mass study

  • A. L. Saraiva
  • , M. J. Calderón
  • , Rodrigo B. Capaz
  • , Xuedong Hu
  • , S. Das Sarma
  • , Belita Koiller
  • Universidade Federal do Rio de Janeiro
  • Instituto de Ciencia de Materiales de Madrid (CSIC)
  • University of Maryland, College Park

Research output: Contribution to journalArticlepeer-review

69 Scopus citations

Abstract

Orbital degeneracy of the electronic conduction band edge in silicon is a potential roadblock to the storage and manipulation of quantum information involving the electronic spin degree of freedom in this host material. This difficulty may be mitigated near an interface between Si and a barrier material, where intervalley scattering may couple states in the conduction ground state, leading to nondegenerate orbital ground and first excited states. The level splitting is experimentally found to have a strong sample dependence, varying by orders of magnitude for different interfaces and samples. The basic physical mechanisms leading to such coupling in different systems are addressed. We expand our recent study based on an effective mass approach, incorporating the full plane-wave expansions of the Bloch functions at the conduction band minima. Physical insights emerge naturally from a simple Si/barrier model. In particular, we present a clear comparison between ours and different approximations and formalisms adopted in the literature and establish the applicability of these approximations in different physical scenarios.

Original languageEnglish
Article number155320
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume84
Issue number15
DOIs
StatePublished - Oct 27 2011

Fingerprint

Dive into the research topics of 'Intervalley coupling for interface-bound electrons in silicon: An effective mass study'. Together they form a unique fingerprint.

Cite this