INTERMEDIATE VOLTAGE MICROSCOPY.

Krishna Rajan; Peter Sewell

INTERMEDIATE VOLTAGE MICROSCOPY.

Krishna Rajan
, Peter Sewell

Department of Materials Design and Innovation

Research output: Contribution to journal › Article › peer-review

Abstract

By examining the advantages and limitations of electron microscopy at intermediate voltages (greater than 100 kv but less than 500 kv), this article emphasizes aspects of microscopy that cannot be performed using 100 kv instruments as well as applications that previously required instruments operating at greater than 500 kv. Based on early results, intermediate voltage microscopy appears to be achieving theoretical predictions.

Original language	English
Pages (from-to)	30-31
Number of pages	2
Journal	Journal of Metals
Volume	38
Issue number	12
State	Published - Dec 1986

Cite this

@article{7617a59db53b4b1db135c52f7a5bb859,

title = "INTERMEDIATE VOLTAGE MICROSCOPY.",

abstract = "By examining the advantages and limitations of electron microscopy at intermediate voltages (greater than 100 kv but less than 500 kv), this article emphasizes aspects of microscopy that cannot be performed using 100 kv instruments as well as applications that previously required instruments operating at greater than 500 kv. Based on early results, intermediate voltage microscopy appears to be achieving theoretical predictions.",

author = "Krishna Rajan and Peter Sewell",

year = "1986",

month = dec,

language = "English",

volume = "38",

pages = "30--31",

journal = "Journal of Metals",

issn = "1047-4838",

publisher = "Minerals, Metals and Materials Society",

number = "12",

}

TY - JOUR

T1 - INTERMEDIATE VOLTAGE MICROSCOPY.

AU - Rajan, Krishna

AU - Sewell, Peter

PY - 1986/12

Y1 - 1986/12

N2 - By examining the advantages and limitations of electron microscopy at intermediate voltages (greater than 100 kv but less than 500 kv), this article emphasizes aspects of microscopy that cannot be performed using 100 kv instruments as well as applications that previously required instruments operating at greater than 500 kv. Based on early results, intermediate voltage microscopy appears to be achieving theoretical predictions.

AB - By examining the advantages and limitations of electron microscopy at intermediate voltages (greater than 100 kv but less than 500 kv), this article emphasizes aspects of microscopy that cannot be performed using 100 kv instruments as well as applications that previously required instruments operating at greater than 500 kv. Based on early results, intermediate voltage microscopy appears to be achieving theoretical predictions.

UR - https://www.scopus.com/pages/publications/0022863585

M3 - Article

AN - SCOPUS:0022863585

SN - 1047-4838

VL - 38

SP - 30

EP - 31

JO - Journal of Metals

JF - Journal of Metals

IS - 12

ER -

INTERMEDIATE VOLTAGE MICROSCOPY.

Abstract

Other files and links

Fingerprint

Cite this