Abstract
The process of ion formation in static secondary ion mass spectrometry from functionalized polymer surfaces has been investigated using a polymerizable Langmuir-Blodgett film as a model system. In this study the variation in signal intensity of charge stabilized positive ions from the polymerizable quaternary amine amide diacetylene compound (B1P51) are used to monitor the process of polymerization, substrate chemistry (Au, Ag, and Ge film substrate), and variation due to film deposition method (i.e., Langmuir-Blodgett, solution cast). Each affects the type of film surface formed. Coverage, film thickness, homogeneity, and molecular structure and composition are obtained from x-ray photoelectron [XPS or electron spectroscopy for chemical analysis (ESCA)] and Fourier transform infrared (FTIR) spectroscopy measurements. Comparisons between ESCA and FTIR analyses have been used to determine the polymerization mechanism of the diacetylene. Correlations between changes in the ESCA N 1s core electron region and changes in the secondary ion yields are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 1795-1800 |
| Number of pages | 6 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 7 |
| Issue number | 3 |
| DOIs | |
| State | Published - May 1989 |
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