Instrumentation for Reliably Determining Porous Silicon Photoluminescence Responses to Gaseous Analyte Vapors

Justin M. Reynard; Nathan S. Van Gorder; Caley A. Richardson; Richie D. Eriacho; Frank V. Bright

doi:10.1177/0003702816653125

Instrumentation for Reliably Determining Porous Silicon Photoluminescence Responses to Gaseous Analyte Vapors

Justin M. Reynard
, Nathan S. Van Gorder
, Caley A. Richardson
, Richie D. Eriacho
, Frank V. Bright

Chemistry

Erie Community College
KIK Custom Products
Lenape Valley Regional High School
SUNY Buffalo

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We report new instrumentation for rapidly and reliably measuring the temperature-dependent photoluminescence response from porous silicon as a function of analyte vapor concentration. The new system maintains the porous silicon under inert conditions and it allows on-the-fly steady-state and time-resolved photoluminescence intensity and hyper-spectral measurements between 293 K and 450 K. The new system yields reliable data at least 100-fold faster in comparison to previous instrument platforms.

Original language	English
Pages (from-to)	1974-1980
Number of pages	7
Journal	Applied Spectroscopy
Volume	70
Issue number	12
DOIs	https://doi.org/10.1177/0003702816653125
State	Published - Dec 2016

Keywords

photoluminescence
Porous silicon
Stern-Volmer quenching
temperature dependence

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10.1177/0003702816653125

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@article{eea8298322c64d22aa2a645b9751a297,

title = "Instrumentation for Reliably Determining Porous Silicon Photoluminescence Responses to Gaseous Analyte Vapors",

abstract = "We report new instrumentation for rapidly and reliably measuring the temperature-dependent photoluminescence response from porous silicon as a function of analyte vapor concentration. The new system maintains the porous silicon under inert conditions and it allows on-the-fly steady-state and time-resolved photoluminescence intensity and hyper-spectral measurements between 293 K and 450 K. The new system yields reliable data at least 100-fold faster in comparison to previous instrument platforms.",

keywords = "photoluminescence, Porous silicon, Stern-Volmer quenching, temperature dependence",

author = "Reynard, \{Justin M.\} and \{Van Gorder\}, \{Nathan S.\} and Richardson, \{Caley A.\} and Eriacho, \{Richie D.\} and Bright, \{Frank V.\}",

note = "Publisher Copyright: {\textcopyright} 2016 Society for Applied Spectroscopy.",

year = "2016",

month = dec,

doi = "10.1177/0003702816653125",

language = "English",

volume = "70",

pages = "1974--1980",

journal = "Applied Spectroscopy",

issn = "0003-7028",

publisher = "SAGE Publications Inc.",

number = "12",

}

TY - JOUR

T1 - Instrumentation for Reliably Determining Porous Silicon Photoluminescence Responses to Gaseous Analyte Vapors

AU - Reynard, Justin M.

AU - Van Gorder, Nathan S.

AU - Richardson, Caley A.

AU - Eriacho, Richie D.

AU - Bright, Frank V.

PY - 2016/12

Y1 - 2016/12

N2 - We report new instrumentation for rapidly and reliably measuring the temperature-dependent photoluminescence response from porous silicon as a function of analyte vapor concentration. The new system maintains the porous silicon under inert conditions and it allows on-the-fly steady-state and time-resolved photoluminescence intensity and hyper-spectral measurements between 293 K and 450 K. The new system yields reliable data at least 100-fold faster in comparison to previous instrument platforms.

AB - We report new instrumentation for rapidly and reliably measuring the temperature-dependent photoluminescence response from porous silicon as a function of analyte vapor concentration. The new system maintains the porous silicon under inert conditions and it allows on-the-fly steady-state and time-resolved photoluminescence intensity and hyper-spectral measurements between 293 K and 450 K. The new system yields reliable data at least 100-fold faster in comparison to previous instrument platforms.

KW - photoluminescence

KW - Porous silicon

KW - Stern-Volmer quenching

KW - temperature dependence

UR - https://www.scopus.com/pages/publications/85006324713

U2 - 10.1177/0003702816653125

DO - 10.1177/0003702816653125

M3 - Article

AN - SCOPUS:85006324713

SN - 0003-7028

VL - 70

SP - 1974

EP - 1980

JO - Applied Spectroscopy

JF - Applied Spectroscopy

IS - 12

ER -

Instrumentation for Reliably Determining Porous Silicon Photoluminescence Responses to Gaseous Analyte Vapors

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Keywords

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