Informatics for quantitative analysis of atom probe tomography images

Santosh K. Suram; Krishna Rajan

Informatics for quantitative analysis of atom probe tomography images

Santosh K. Suram
, Krishna Rajan

Department of Materials Design and Innovation

Iowa State University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

An informatics based approach to extract refinements on the crystallographic information embedded in the Spatial Distribution Maps (SDMs) is developed. The complex SDM data is deconvoluted into meaningful spectra using Singular Value Decomposition (SVD). The interpretation of structural information from these spectra and generation of refined SDMs is discussed in detail. Our approach results in a method to generate SDMs that can map three-dimensional crystallographic information as opposed to existing methods that map structural information on only one atomic plane at a time. The broader implications of this work on enhancing the interpretation and resolution of structural information in atom probe tomography studies are also discussed.

Original language	English
Title of host publication	Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution
Pages	7-12
Number of pages	6
State	Published - 2010
Event	2009 MRS Fall Meeting - Boston, MA, United States Duration: Nov 30 2009 → Dec 4 2009

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	1231
ISSN (Print)	0272-9172

Conference

Conference	2009 MRS Fall Meeting
Country/Territory	United States
City	Boston, MA
Period	11/30/09 → 12/4/09

Cite this

@inproceedings{8784e5db3f6945f89e9b1e7508cce9bd,

title = "Informatics for quantitative analysis of atom probe tomography images",

abstract = "An informatics based approach to extract refinements on the crystallographic information embedded in the Spatial Distribution Maps (SDMs) is developed. The complex SDM data is deconvoluted into meaningful spectra using Singular Value Decomposition (SVD). The interpretation of structural information from these spectra and generation of refined SDMs is discussed in detail. Our approach results in a method to generate SDMs that can map three-dimensional crystallographic information as opposed to existing methods that map structural information on only one atomic plane at a time. The broader implications of this work on enhancing the interpretation and resolution of structural information in atom probe tomography studies are also discussed.",

author = "Suram, \{Santosh K.\} and Krishna Rajan",

year = "2010",

language = "English",

isbn = "9781617822124",

series = "Materials Research Society Symposium Proceedings",

pages = "7--12",

booktitle = "Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution",

note = "2009 MRS Fall Meeting ; Conference date: 30-11-2009 Through 04-12-2009",

}

Informatics for quantitative analysis of atom probe tomography images. / Suram, Santosh K.; Rajan, Krishna.
Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution. 2010. p. 7-12 (Materials Research Society Symposium Proceedings; Vol. 1231).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Informatics for quantitative analysis of atom probe tomography images

AU - Suram, Santosh K.

AU - Rajan, Krishna

PY - 2010

Y1 - 2010

N2 - An informatics based approach to extract refinements on the crystallographic information embedded in the Spatial Distribution Maps (SDMs) is developed. The complex SDM data is deconvoluted into meaningful spectra using Singular Value Decomposition (SVD). The interpretation of structural information from these spectra and generation of refined SDMs is discussed in detail. Our approach results in a method to generate SDMs that can map three-dimensional crystallographic information as opposed to existing methods that map structural information on only one atomic plane at a time. The broader implications of this work on enhancing the interpretation and resolution of structural information in atom probe tomography studies are also discussed.

AB - An informatics based approach to extract refinements on the crystallographic information embedded in the Spatial Distribution Maps (SDMs) is developed. The complex SDM data is deconvoluted into meaningful spectra using Singular Value Decomposition (SVD). The interpretation of structural information from these spectra and generation of refined SDMs is discussed in detail. Our approach results in a method to generate SDMs that can map three-dimensional crystallographic information as opposed to existing methods that map structural information on only one atomic plane at a time. The broader implications of this work on enhancing the interpretation and resolution of structural information in atom probe tomography studies are also discussed.

UR - https://www.scopus.com/pages/publications/79951965866

M3 - Conference contribution

AN - SCOPUS:79951965866

SN - 9781617822124

T3 - Materials Research Society Symposium Proceedings

SP - 7

EP - 12

BT - Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution

T2 - 2009 MRS Fall Meeting

Y2 - 30 November 2009 through 4 December 2009

ER -

Informatics for quantitative analysis of atom probe tomography images

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