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Influence of defect-induced biaxial strain on flux pinning in thick YBa 2Cu 3O 7 layers

  • Vyacheslav F. Solovyov
  • , Qiang Li
  • , Weidong Si
  • , Boris Maiorov
  • , Timothy J. Haugan
  • , J. L. MacManus-Driscoll
  • , H. Yao
  • , Q. X. Jia
  • , E. D. Specht
  • Brookhaven National Laboratory Condensed Matter Physics and Materials Science Department
  • Los Alamos National Laboratory
  • Air Force Research Laboratory
  • University of Cambridge
  • Soochow University
  • Oak Ridge National Laboratory

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

This work reports a detailed structural study by synchrotron x-ray diffraction of several sets of thick YBa 2Cu 3O 7 layers. The samples represent recent advances in flux-pinning design, containing various concentrations of artificial pinning centers: (i) BaZrO 3 nanorods, (ii) BaZrO 3 nanoparticles, and (iii) Y 2O 3 nanoparticles. A statistical analysis was performed in order to separate the effects of defect-induced and intrinsic pinning. We report a statistically significant correlation between the orthorhombic distortion of the YBCO matrix and the pinning strength. Our result implies that the in-plane ordering of oxygen ions in the chain positions accounts for approximately 60% of the pinning force. The strain-induced pinning mechanism analysis, based on the Eshelby model of elastically strained composites, predicts that small YBCO grain size is a critical component of a strong pinning architecture that can enable critical current density values approaching the depairing limit.

Original languageEnglish
Article number094511
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume86
Issue number9
DOIs
StatePublished - Sep 12 2012

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