TY - GEN
T1 - Impact evaluation of series dc arc faults in dc microgrids
AU - Yao, Xiu
AU - Herrera, Luis
AU - Wang, Jin
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/5/8
Y1 - 2015/5/8
N2 - This paper evaluates possible impacts of series dc arc faults to dc microgrids. Series dc arc can happen at various locations of a dc microgrid and is associated with high impedance and low fault current level, which adds difficulty to detection and protection. This paper firstly presents dc arc fault modeling of both dc component and high frequency noise component. With the dc arc model, the impact of dc arc faults at various locations of a dc microgrid are then studied. Two different controllers are adopted to study the interaction between dc arc faults and microgrid controllers. It is found that current and voltage control strategies can have adverse impact to dc arc faults and dc arc faults at certain locations can be very difficult to detect with existing dc microgrid protection strategies. Additional dc arc fault detectors are of necessity to improve the overall safety of the microgrid.
AB - This paper evaluates possible impacts of series dc arc faults to dc microgrids. Series dc arc can happen at various locations of a dc microgrid and is associated with high impedance and low fault current level, which adds difficulty to detection and protection. This paper firstly presents dc arc fault modeling of both dc component and high frequency noise component. With the dc arc model, the impact of dc arc faults at various locations of a dc microgrid are then studied. Two different controllers are adopted to study the interaction between dc arc faults and microgrid controllers. It is found that current and voltage control strategies can have adverse impact to dc arc faults and dc arc faults at certain locations can be very difficult to detect with existing dc microgrid protection strategies. Additional dc arc fault detectors are of necessity to improve the overall safety of the microgrid.
UR - https://www.scopus.com/pages/publications/84937907460
U2 - 10.1109/APEC.2015.7104771
DO - 10.1109/APEC.2015.7104771
M3 - Conference contribution
AN - SCOPUS:84937907460
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 2953
EP - 2958
BT - APEC 2015 - 30th Annual IEEE Applied Power Electronics Conference and Exposition
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015
Y2 - 15 March 2015 through 19 March 2015
ER -