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Identifying police officers at risk of adverse events

  • Samuel Carton
  • , Jennifer Helsby
  • , Kenneth Joseph
  • , Ayesha Mahmud
  • , Youngsoo Park
  • , Joe Walsh
  • , Crystal Cody
  • , C. P.T.Estella Patterson
  • , Lauren Haynes
  • , Rayid Ghani
  • University of Michigan, Ann Arbor
  • The University of Chicago
  • Princeton University
  • University of Arizona
  • Charlotte-Mecklenburg Police Department

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

30 Scopus citations

Abstract

Adverse events between police and the public, such as deadly shootings or instances of racial profiling, can cause serious or deadly harm, damage police legitimacy, and result in costly litigation. Evidence suggests these events can be prevented by targeting interventions based on an Early Intervention System (EIS) that flags police officers who are at a high risk for involvement in such adverse events. Today's EIS are not data-driven and typically rely on simple thresholds based entirely on expert intuition. In this paper, we describe our work with the Charlotte-Mecklenburg Police Department (CMPD) to develop a machine learning model to predict which officers are at risk for an adverse event. Our approach significantly outperforms CMPD's existing EIS, increasing true positives by ∼ 12% and decreasing false positives by ∼ 32%. Our work also sheds light on features related to officer characteristics, situational factors, and neigh-borhood factors that are predictive of adverse events. This work provides a starting point for police departments to take a comprehensive, data-driven approach to improve policing and reduce harm to both officers and members of the public.

Original languageEnglish
Title of host publicationKDD 2016 - Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
PublisherAssociation for Computing Machinery
Pages67-76
Number of pages10
ISBN (Electronic)9781450342322
DOIs
StatePublished - Aug 13 2016
Event22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2016 - San Francisco, United States
Duration: Aug 13 2016Aug 17 2016

Publication series

NameProceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
Volume13-17-August-2016

Conference

Conference22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2016
Country/TerritoryUnited States
CitySan Francisco
Period08/13/1608/17/16

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