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Higher-order Wavelet Statistics and their Application to Digital Forensics

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

201 Scopus citations

Abstract

We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that capture certain statistical regularities of natural images. We show how this model can be useful in several digital forensic applications, specifically in detecting various types of digital tampering.

Original languageEnglish
Title of host publication2003 Conference on Computer Vision and Pattern Recognition Workshop, CVPRW 2003
PublisherIEEE Computer Society
ISBN (Electronic)0769519008
DOIs
StatePublished - 2003
EventConference on Computer Vision and Pattern Recognition Workshop, CVPRW 2003 - Madison, United States
Duration: Jun 16 2003Jun 22 2003

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume8
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

ConferenceConference on Computer Vision and Pattern Recognition Workshop, CVPRW 2003
Country/TerritoryUnited States
CityMadison
Period06/16/0306/22/03

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