High-temperature superconductor edge-geometry SNS junctions with engineered normal-metal layers

Q. X. Jia; D. Reagor; H. Kung; M. Hawley; C. Mombourquette; S. R. Foltyn; X. D. Wu; D. E. Peterson

doi:10.1088/0953-2048/9/11/010

High-temperature superconductor edge-geometry SNS junctions with engineered normal-metal layers

Q. X. Jia
, D. Reagor
, H. Kung
, M. Hawley
, C. Mombourquette
, S. R. Foltyn
, X. D. Wu
, D. E. Peterson

Department of Materials Design and Innovation

Los Alamos National Laboratory

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

High-temperature superconductor Josephson junctions in an edge-geometry superconductor-normal-metal-superconductor (SNS) configuration were fabricated on LaAlO₃ substrates. The normal metal was composed of an engineered multilayer Y_1-xPr_xBa₂Cu₃O_7-δ with different Pr-doping concentrations (x = 0.1, 0.3, or 0.5). Scanning tunnelling microscopy analysis on Y_1-xPr_xBa₂Cu₃O_7-δ thin films provided supporting evidence for the use of such an engineered multilayer as N barrier to fabricate edge-geometry SNS junctions. The improved S-N or N-S interface, as revealed by cross-sectional transmission electron microscopy, explains the negligible interface resistance of the junctions.

Original language	English
Pages (from-to)	985-990
Number of pages	6
Journal	Superconductor Science and Technology
Volume	9
Issue number	11
DOIs	https://doi.org/10.1088/0953-2048/9/11/010
State	Published - Nov 1996

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title = "High-temperature superconductor edge-geometry SNS junctions with engineered normal-metal layers",

abstract = "High-temperature superconductor Josephson junctions in an edge-geometry superconductor-normal-metal-superconductor (SNS) configuration were fabricated on LaAlO3 substrates. The normal metal was composed of an engineered multilayer Y1-xPrxBa2Cu3O7-δ with different Pr-doping concentrations (x = 0.1, 0.3, or 0.5). Scanning tunnelling microscopy analysis on Y1-xPrxBa2Cu3O7-δ thin films provided supporting evidence for the use of such an engineered multilayer as N barrier to fabricate edge-geometry SNS junctions. The improved S-N or N-S interface, as revealed by cross-sectional transmission electron microscopy, explains the negligible interface resistance of the junctions.",

author = "Jia, \{Q. X.\} and D. Reagor and H. Kung and M. Hawley and C. Mombourquette and Foltyn, \{S. R.\} and Wu, \{X. D.\} and Peterson, \{D. E.\}",

year = "1996",

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doi = "10.1088/0953-2048/9/11/010",

language = "English",

volume = "9",

pages = "985--990",

journal = "Superconductor Science and Technology",

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T1 - High-temperature superconductor edge-geometry SNS junctions with engineered normal-metal layers

AU - Jia, Q. X.

AU - Reagor, D.

AU - Kung, H.

AU - Hawley, M.

AU - Mombourquette, C.

AU - Foltyn, S. R.

AU - Wu, X. D.

AU - Peterson, D. E.

PY - 1996/11

Y1 - 1996/11

N2 - High-temperature superconductor Josephson junctions in an edge-geometry superconductor-normal-metal-superconductor (SNS) configuration were fabricated on LaAlO3 substrates. The normal metal was composed of an engineered multilayer Y1-xPrxBa2Cu3O7-δ with different Pr-doping concentrations (x = 0.1, 0.3, or 0.5). Scanning tunnelling microscopy analysis on Y1-xPrxBa2Cu3O7-δ thin films provided supporting evidence for the use of such an engineered multilayer as N barrier to fabricate edge-geometry SNS junctions. The improved S-N or N-S interface, as revealed by cross-sectional transmission electron microscopy, explains the negligible interface resistance of the junctions.

AB - High-temperature superconductor Josephson junctions in an edge-geometry superconductor-normal-metal-superconductor (SNS) configuration were fabricated on LaAlO3 substrates. The normal metal was composed of an engineered multilayer Y1-xPrxBa2Cu3O7-δ with different Pr-doping concentrations (x = 0.1, 0.3, or 0.5). Scanning tunnelling microscopy analysis on Y1-xPrxBa2Cu3O7-δ thin films provided supporting evidence for the use of such an engineered multilayer as N barrier to fabricate edge-geometry SNS junctions. The improved S-N or N-S interface, as revealed by cross-sectional transmission electron microscopy, explains the negligible interface resistance of the junctions.

UR - https://www.scopus.com/pages/publications/0030282364

U2 - 10.1088/0953-2048/9/11/010

DO - 10.1088/0953-2048/9/11/010

M3 - Article

AN - SCOPUS:0030282364

SN - 0953-2048

VL - 9

SP - 985

EP - 990

JO - Superconductor Science and Technology

JF - Superconductor Science and Technology

IS - 11

ER -

High-temperature superconductor edge-geometry SNS junctions with engineered normal-metal layers

Abstract

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