Abstract
A new technique for testing the reliability of thin dielectrics used in power electronics components insulation is presented. Under voltages above the Paschen minimum, fast transients create an intense-corona environment, causing premature electrochemical aging followed by premature insulation failure. The new method determines safety margins based on understanding the aging rates. Tests with polypropylene films demonstrated that the voltage dependence follows nearly that seen for intense corona DC and AC voltage applications, and the higher repetition rate to permit greater pulse life than lower ones. Engineering practices to obviate the observed very high aging rates of such systems are recommended.
| Original language | English |
|---|---|
| Pages | 312-328 |
| Number of pages | 17 |
| State | Published - 1998 |
| Event | Proceedings of the 1998 3rd International Conference on Electric Charge in Solid Insulators, CSC'3 - Paris, Fr Duration: Jun 29 1998 → Jul 3 1998 |
Conference
| Conference | Proceedings of the 1998 3rd International Conference on Electric Charge in Solid Insulators, CSC'3 |
|---|---|
| City | Paris, Fr |
| Period | 06/29/98 → 07/3/98 |
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