Skip to main navigation Skip to search Skip to main content

High-Reflectivity DUV Mirrors Prepared by Direct Sputtering

  • Hongjun Yang
  • , Deyin Zhao
  • , Shih Chia Liu
  • , Yonghao Liu
  • , Jung Hun Seo
  • , Matt Hodek
  • , Zhenqiang Ma
  • , John D. Albrecht
  • , Baxter Moody
  • , Weidong Zhou
  • University of Texas at Arlington
  • Michigan State University
  • University of Wisconsin-Madison
  • HexaTech, Inc.

Research output: Contribution to journalConference articlepeer-review

Abstract

We report here high-reflectivity multilayer DBR mirrors in 200-240 nm spectral region. YSZ (yttria-stabilized zirconia), HfO2 and SiO2 films were all prepared by direct RF magnetron sputtering. The film annealing conditions were systematically varied to obtain layers with minimal optical absorption. Combining these results, high reflectivity YSZ/SiO2 and HfO2/SiO2 DBRs were designed and realized with reflectance greater than 99.9%.

Original languageEnglish
Article number2016-STu3R.3
JournalOptics InfoBase Conference Papers
StatePublished - 2016
EventCLEO: Science and Innovations, SI 2016 - San Jose, United States
Duration: Jun 5 2016Jun 10 2016

Fingerprint

Dive into the research topics of 'High-Reflectivity DUV Mirrors Prepared by Direct Sputtering'. Together they form a unique fingerprint.

Cite this