Abstract
The combination of high-growth-temperature GaAs spacer layers and high-reflectivity (HR)-coated facets has been utilized to obtain low threshold currents and threshold current densities for 1.3-μm multilayer InAs-GaAs quantum-dot lasers. A very low Continuous-wave (CW) room-temperature threshold current of 1.5 mA and a threshold current density of 18.8 A/cm2 are achieved for a three-layer device with a 1-mm HR/HR cavity. For a 2-mm cavity, the CW threshold current density is as low as 17 A/cm2 for an HR/HR device. An output power as high as 100 mW is obtained for a device with HR/cleaved facets.
| Original language | English |
|---|---|
| Pages (from-to) | 1139-1141 |
| Number of pages | 3 |
| Journal | IEEE Photonics Technology Letters |
| Volume | 17 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 2005 |
Keywords
- Epitaxial growth
- Quantum dots (QDs)
- Semiconductor diodes
- Semiconductor lasers
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